Translation examples
Top Analytica Oy:n tarjoaman analyysipalvelun XPS/ESCA instrumentilla voidaan puolijohdemateriaalien alkuainejakaumaa tarkastella syvyyssuunnassa alle nanometrin resoluutiolla.
The analytical service XPS / ESCA instrument provided by Top Analytica Oy can measure the elemental distribution of semiconductor materials in the depth direction with a resolution of less than one nanometer.
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